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7 research outputs found
Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation Method
Author
A Ushida
B Kim
+23Â more
D Liu
DK Papakostas
G Fedi
H Dai
JA Starzyk
JS Augusto
JW Bandler
L Economikos
M Aminian
M Catelani
M Tadeusiewicz
M Tadeusiewicz
M Tadeusiewicz
Michał Tadeusiewicz
N Navid
RS Palais
S Bhunia
SL Richter
Stanisław Hałgas
T Ozawa
TL Quarles
Y Hongkui
Y Miura
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
Full text link
Crossref
Controlling the Dimensions of Laser Chemical Vapor Deposited Metallurgy
Author
D. E. Kotecki
L. Economikos
R. Surprenant
Publication venue
'ASME International'
Publication date
Field of study
No full text
Crossref
A Survey of Test Techniques for MCM Substrates
Author
A Halperin
A Hopper
+11Â more
AW Ross
B Kim
B Kim
F Crnic
H Hamel
J Marshall
L Economikos
M Brunner
OC Woodard
RW Wedwick
SD Golladay
Publication venue
'Springer Science and Business Media LLC'
Publication date
01/01/1997
Field of study
No full text
Crossref
Method and compositions for electrochemical-mechanical polishing
Author
ANDRICACOS P
CANAPERI D.F
+11Â more
COOPER E.I
COTTE J.M
DELIGIANNI H
ECONOMIKOS L
EDELSTEIN D.C
KRISHNAN M
MANSSON A.P
PRANATHARTHIHARAN B.S
S. FRANZ
WALTON E.G
WEST A.C
Publication venue
Publication date
01/01/2006
Field of study
No full text
Archivio istituzionale della ricerca - Politecnico di Milano
Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology
Author
A Robotycki
B Kim
+23Â more
B Provost
DK Papakostas
F Gao
G Fedi
K Huang
L Economikos
M Aminian
M Catelani
M Jahangiri
M Tadeusiewicz
M Tadeusiewicz
M Tadeusiewicz
M Tadeusiewicz
M Tadeusiewicz
M Tadeusiewicz
MA Luersen
Michał Tadeusiewicz
P Kabisatpathy
RJ Baker
S Bhunia
S Singer
Stanisław Hałgas
Z Wang
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
Crossref
Advanced Planarization Techniques
Author
A. C West
A. C West
+41Â more
A. C West
B Du
B Stickney
B. M Basol
B. M Basol
B. M Basol
B. M Basol
B. M Basol
D Landolt
D Padhi
D. Josell
G Kloster
I. I Suni
J Huo
J Huo
J. L Plawsky
L Economikos
M Datta
P Leduc
P Singer
P Taephaisitphongse
P. C Andricacos
R Contolini
R Vidal
S Aksu
S Kondo
S Kondo
S Kondo
S Lopatin
S Maitrejean
S Mazur
S. C Chang
S. C Chang
S. H Chang
S. H Liu
T Matsuda
T. P Moffat
T. P Moffat
W. P. Dow
Y Cao
Y Wada
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
Crossref
Patterned Wafer Effects
Author
A Chatterjee
A Francis
+84Â more
A Kahng
A Romer
B Lee
B Smith
B Stine
B Stine
BH Kwon
C Gillot
C Yu
D Evans
D Goetz
D Hansen
D Hetherington
D Hetherington
D Hetherington
D Hetherington
D Hetherington
DR Cote
DR Evans
G Badenes
G Liu
H Kranenburg
H Landis
IY Yoon
J Boyd
J Gagliardi
J Gagliardi
J Grillaert
J Grillaert
J Grillaert
J Mckinnis
J Schlueter
J Warnock
JM Steigerwald
JT Pan
JT Pan
K Achuthan
K Devriendt
K Devriendt
K Goh
K Smekalin
KS Choi
L Cook
L Economikos
LM Cook
M Borba
M Fayolle
M Fayolle
M Gostein
M Gostein
M Oliver
N Elbel
P Lefevre
P Renteln
P Renteln
P Velden
P Wrschka
PA Burke
R Tian
R Tian
R Tian
S Kweon
S Sivaram
S Wolf
SI Lee
SJ Kim
SV Nguyen
T Daubenspeck
T Murakami
T Park
T Park
T Park
T Park
T Park
T Park
T Park
T Park
T Tugbawa
T Tugbawa
VN Koinkar
W Li
W Patrick
Y Hayashide
Z Stavreva
Publication venue
'Springer Science and Business Media LLC'
Publication date
01/01/2004
Field of study
No full text
Crossref